EXHIBITOR INFO


Company: Linkoptik Instruments Co., Ltd. 
Business Nature: Manufacturer  Linkoptik Instruments Co., Ltd._logo
Country/Region: P.R. China 
Hall No.: 5.1 
Zone No.:
Booth No.: 5.1B65 

Profile in English:
 

Linkoptik Instrument Co., Ltd. adheres to the "scientific attitude, craftsman spirit", and is positioned in the manufacture of high-end particle characterization instruments, focusing on the basic theoretical research, technological innovation, quality control and application solutions of particle characterization instruments, and is determined to achieve high-end particle characterization instruments. Products include laser (diffraction method) particle size analysis, dynamic light scattering nanoparticle size and Zeta potential analyzers and particle image analyzers, both laboratory instruments and online detection systems. 


Linkoptik brings together top talents in the field of particle characterization in China headed by Dr. Zhang Fugen. Dr. Fugen Zhang is the vice-chairman of the China Particle Characterization Standardization Technical Committee, the former vice-chairman of the China Particle Society, an adjunct professor at Tianjin University and the founder of several companies under Omega. In addition, Mr. Qin Heyi, who has served as the general manager of Malvern Instruments (China) in the United Kingdom for more than 20 years, postdoctoral fellow Pan Linchao, a young director of the Chinese Society of Particles, Dr. Chen Jin, a young director of the Chinese Society of Particles, and many others with rich experience and experience in the field of particle science and powder technology. Elite talents who have achieved work are all employed in the company. 


In just a few years, the team of Linkoptik has achieved a series of breakthrough innovations. In the aspect of laser particle size analyzer, the abnormal change phenomenon (ACAD) of the diffraction spot (Airy disk) was found, which explained why polystyrene microspheres of about 3 ¦Ìm could not be measured, and gave the abnormal area (the particle size could not be measured). General formula; proposed an inclined trapezoidal window technical scheme (patent), solved the problem of the blind area of forward super-angle measurement, and significantly improved the sub-micron particle measurement level of the instrument; proposed a unified inversion algorithm (proprietary technology), The embarrassment of different results in different modes is relieved; an ultra-high-speed parallel data sampling circuit up to 20kHz is designed, so that the accuracy of dry measurement is no less than that of wet measurement, and the measurement (time) resolution of high-speed spray field is also higher. 


For nano-particle size and Zeta potential meter, Linkoptik has proposed a more advanced cosine fitting method (CFLS) than phase analysis method (PALS), replacing the traditional flat beam splitter with optical fiber splitting by optical fiber internal light interference. Free space interference greatly improves the measurement repeatability of Zeta potential, far exceeding the indicators of such instruments at home and abroad. Everything in the past is a preface. Linkoptik will always maintain a pure heart of chasing dreams, guided by the spirit of science, guided by scientific principles, seeking truth with a scientific attitude, and providing customers with truly innovative technical solutions; particle characterization involves Provide high-end advanced and reliable instruments and equipment for dozens of industries; contribute feelings and strength to the development of particle characterization industry and China's powder industry!


Classification of Exhibits:
 
  • 1 Raw Materials For Coating, Inks & Adhesives
  •   1.1 Resins & Binders
  •   1.2 Pigments, Extenders & Fillers
  • 2 Powder Coatings Technology
  • 5 Coatings, Printing Inks & Adhesive Products
  • 6 Measurement & Testing of Coatings for QC/R&D