Linkoptik​ specializes in the R&D and manufacturing of high-end particle characterization instruments. Its products include Laser Particle Size Analyzers, Nanoparticle Size/Zeta Potential Analyzers, and Particle Image Analyzers, serving both laboratory and online systems. The company adheres to "Scientific Attitude, Craftsmanship Spirit," delivering world-class advanced products and services.

Linkoptik is led by top-tier talent: ​Dr. Zhang Fugen​ (Chairman and Chief Scientist) currently serves as Vice Chairman of the Particle Characterization Standardization Technical Committee, Standing Council Member of the Chinese Society of Particle Technology, and Professor at Tianjin University (Tian Da). Former Vice Chairman of the Society, he is also the founder of "Omec." ​Mr. Qin Heyi, Commercial General Manager, brings over 20 years' experience managing the China operations of a UK particle sizing instrument company. ​Dr. Pan Linchao​ and ​Dr. Chen Jin​ (Young Council Members of the Chinese Society of Particle Technology) lead R&D efforts.

Addressing market shortcomings, the team has driven systematic innovation:

• Discovered ​Anomalous Changes of Airy Disk (ACAD)​, explaining the unmeasurability of 3μm polystyrene microspheres and establishing the anomaly zone formula;
• Researched measurement boundaries of diffraction instruments;
• Invented ​two methods for estimating particle refractive index based on scattered light;
• Proposed the patented ​Slanted Trapezoidal Window, eliminating the large forward-angle blind spot and enhancing sub-micron measurement;
• Developed the proprietary ​Unified Inversion Algorithm​ to resolve result inconsistencies;
• Designed an ultra-high-speed ​20kHz sampling circuit, improving dry measurement precision and resolution for high-speed spray fields.

For nano-instruments, Linkoptik introduced the advanced ​Cosine Fitting Phase Analysis Light Scattering (CF-PALS)​​ method, replacing traditional beam splitters and free-space interference with ​fiber-optic beam splitting​ and ​internal fiber-optic interference, significantly boosting Zeta Potential measurement repeatability.